Add to Cart Efficiencies and Workplace Environmental Impact Improvements in Mold Wrap Applications MSRP: Was: Now: $25.00 PaperID: 331 EventID: 1 Author: Chris Johnson, Morgan Thermal Ceramics &nb…
Add to Cart EGAL Clean Steel Melting & Casting at ICS Florida MSRP: Was: Now: $25.00 PaperID: 1006 EventID: 20 Author: Bill Laiacono, ICS Florida, Terence LaSorda,…
Add to Cart Electron Beam Refining of Superalloy Revert for Foundries MSRP: Was: Now: $25.00 PaperID: 333 EventID: 4 Author: Dr. Ulrich Muerrle, Degussa Corporation &n…
Add to Cart Electron Beam Remelt Technology Advancements MSRP: Was: Now: $25.00 PaperID: 334 EventID: 4 Author: Jack R. Mosher and Dr. Michael Krehl, Degussa …
Add to Cart Factors to Consider When Using Ceramics to Filter Molten Metals MSRP: Was: Now: $25.00 PaperID: 357 EventID: 4 Author: Stuart Uram and Tyler Schick, Certech Inc. …
Add to Cart Filtration: Molten Metal Techniques and Economics MSRP: Was: Now: $25.00 PaperID: 364 EventID: 4 Author: John W. Graham, Donald W. Graham, Dale Kepner,…
Add to Cart High Purity Hot Topping Compounds MSRP: Was: Now: $25.00 PaperID: 405 EventID: 4 Author: John Briggs, FOSECO Paper Pages: 22…
Add to Cart Immediate Cost Reductions & Quality Improvements with SPAL Process Inert Blanketing MSRP: Was: Now: $25.00 PaperID: 432 EventID: 4 Author: Douglas Marion Paper Pages: 22 …
Add to Cart Improvement of Cleanliness of Steel Melts MSRP: Was: Now: $25.00 PaperID: 443 EventID: 7 Author: Bruno Fragoso, Zollern & Comandita Abstract: The correct choice …
Add to Cart Improvements in Castability and Resultant Cost Savings Through SPAL™ Processing MSRP: Was: Now: $25.00 PaperID: 444 EventID: 4 Author: Terry Hildreth, Semco, Inc., K. Till and J. Pa…
Add to Cart Inclusions and Melt-Crucible Reactions in VIM Nickel-base Alloys MSRP: Was: Now: $25.00 PaperID: 448 EventID: 4 Author: D. W. Gusching and D. R. Poirier Pa…
Add to Cart Induction Melting for Quality and Cost Optimization MSRP: Was: Now: $25.00 PaperID: 452 EventID: 4 Author: T. Klemp, III, D. Jack Drage, Remelt Sources I…